Electron Microscopy Glossary
- Diese Version:
- https://purls.helmholtz-metadaten.de/emg/v2.0.0/
- Vorherige Version:
- https://purls.helmholtz-metadaten.de/emg/v1.0.0/
- Revision:
- v2.0.0
- Autoren:
- Abril Azocar Guzman
- Volker Hofmann
- Oonagh Brendike-Mannix
- Beteiligte:
- https://orcid.org/0000-0001-5870-4658
- https://orcid.org/0000-0001-6534-4195
- https://orcid.org/0000-0001-8480-4775
- https://orcid.org/0000-0002-0070-4337
- https://orcid.org/0000-0002-1008-4530
- https://orcid.org/0000-0002-1278-4928
- https://orcid.org/0000-0002-1418-0984
- https://orcid.org/0000-0002-1507-9327
- https://orcid.org/0000-0002-2818-5890
- https://orcid.org/0000-0002-3054-8734
- https://orcid.org/0000-0002-4499-0355
- https://orcid.org/0000-0002-5149-603X
- https://orcid.org/0000-0002-6004-2304
- https://orcid.org/0000-0002-6368-2067
- https://orcid.org/0000-0002-7086-1901
- https://orcid.org/0000-0002-7117-5196
- https://orcid.org/0000-0002-8218-3116
- https://orcid.org/0000-0002-9555-7455
- https://orcid.org/0000-0002-9700-4803
- https://orcid.org/0000-0003-0000-4784
- https://orcid.org/0000-0003-0575-2853
- https://orcid.org/0000-0003-0930-082X
- https://orcid.org/0000-0003-1965-7996
- https://orcid.org/0000-0003-2285-9329
- https://orcid.org/0000-0003-2534-0063
- https://orcid.org/0000-0003-4745-9735
- https://orcid.org/0009-0008-6410-7217
- Siehe auch:
- https://codebase.helmholtz.cloud/em_glossary/em_glossary_owl
- Geldgeber:
- Helmholtz-Gemeinschaft Deutscher Forschungszentren
- Nationale Forschungsdateninfrastruktur
- Download Serialisierung:
- Lizenz:
- Visualisierung:
- Zitieren als:
- Azocar Guzman, A., Brendike-Mannix, O., Hofmann, V. (2024), Electron Microscopy Glossary, https://purls.helmholtz-metadaten.de/emg/
Glossary Specification
Electron Microscopy Glossary: überblick zurück zum Inhaltsverzeichnis
Diese Ontologie beinhaltet die folgenden Klassen und Eigenschaften.Klassen
- Acceleration Voltage
- Acquisition Time
- Beam
- Beam Current
- Beam Moving Time
- Beam Path
- Bragg Diffraction
- Bragg's Law
- Camera Length
- Coherent Beam
- Convergence Angle
- Convergent Beam
- Dead Time
- Detector Moving Time
- Diffraction
- Diffraction Pattern
- Disk Of Least Confusion
- Dwell Time
- Dynamic Focus Correction
- Dynamic Refocusing
- Elastic Scattering
- Electron Backscatter Diffraction
- Electron Backscatter Diffraction Pattern
- Electron Beam
- Electron Diffraction
- Electron Diffraction Pattern
- Electron Probe
- Emission Current
- Extraction Voltage
- Filament Current
- Flyback Time
- Focal Length
- Focal Plane
- Focal Point
- Focused Beam
- Frame
- Frame Flyback Time
- Frame Time
- Incident Beam
- Inelastic Scattering
- Ion Beam
- Kikuchi Band
- Kikuchi Diffraction
- Kikuchi Lines
- Kikuchi Pattern
- Monochromatic Beam
- Moving Time
- Point Source
- Pole Piece
- Primary Beam
- Probe Current
- Region Of Interest
- Sample Moving Time
- Scattering
- Scattering Angle
- SEM Backscattering
- Source
- Specimen
- TEM Backscattering
- TEM Forwardscattering
- Tilt Correction
- Time Period
- Transmission Kikuchi Diffraction
- Wait Time
- Working Distance
Electron Microscopy Glossary: Beschreibung zurück zum Inhaltsverzeichnis
The EM Glossary is a widespread community effort to harmonize terminology in the electron and ion microscopies. It is created in a not-for profit collaboration between academic and non-university research institutions including domain and metadata experts. It provides harmonized terminology for application level semantic artifacts to source from and align with.Querverweis für... Electron Microscopy Glossary Klassen, Object Properties und Data Properties zurück zum Inhaltsverzeichnis
Dieser Abschnitt enthält Details für jede Klasse und jedes definierte Property, die definiert wurden durch Electron Microscopy Glossary.Klassen
- Acceleration Voltage
- Acquisition Time
- Beam
- Beam Current
- Beam Moving Time
- Beam Path
- Bragg Diffraction
- Bragg's Law
- Camera Length
- Coherent Beam
- Convergence Angle
- Convergent Beam
- Dead Time
- Detector Moving Time
- Diffraction
- Diffraction Pattern
- Disk Of Least Confusion
- Dwell Time
- Dynamic Focus Correction
- Dynamic Refocusing
- Elastic Scattering
- Electron Backscatter Diffraction
- Electron Backscatter Diffraction Pattern
- Electron Beam
- Electron Diffraction
- Electron Diffraction Pattern
- Electron Probe
- Emission Current
- Extraction Voltage
- Filament Current
- Flyback Time
- Focal Length
- Focal Plane
- Focal Point
- Focused Beam
- Frame
- Frame Flyback Time
- Frame Time
- Incident Beam
- Inelastic Scattering
- Ion Beam
- Kikuchi Band
- Kikuchi Diffraction
- Kikuchi Lines
- Kikuchi Pattern
- Monochromatic Beam
- Moving Time
- Point Source
- Pole Piece
- Primary Beam
- Probe Current
- Region Of Interest
- Sample Moving Time
- Scattering
- Scattering Angle
- SEM Backscattering
- Source
- Specimen
- TEM Backscattering
- TEM Forwardscattering
- Tilt Correction
- Time Period
- Transmission Kikuchi Diffraction
- Wait Time
- Working Distance
Acceleration Voltagec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000004
The potential difference between anode and cathode.
- hat Super-Klassen
- thing c
Acquisition Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000055
time period during which data is acquired.
- Example
-
camera exposure time in an EBSD measurement
-
dwell time in SEM and STEM imaging
-
time period during which image data (e.g. TEM) is acquired
-
time period during which spectroscopic data (e.g. EDS, EELS) is acquired
- hat Super-Klassen
- Time Period c
Beamc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000005
A group of particles which move, on average, in a common direction.
- Source
- https://en.wikipedia.org/wiki/Charged_particle_beam
- hat Super-Klassen
- thing c
- hat Sub-Klassen
- Convergent Beam c, Electron Beam c, Ion Beam c, Monochromatic Beam c, Primary Beam c
Beam Currentc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000006
Electrical current which flows along the beam path.
- hat Super-Klassen
- thing c
Beam Moving Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000056
Moving time during which either the position or the tilt of the beam is altered.
- hat Super-Klassen
- Moving Time c
Beam Pathc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000007
Path which the beam flows along defined by the optical components of the instrument.
- hat Super-Klassen
- thing c
Bragg Diffractionc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000064
Diffraction which follows Bragg's law.
- Source
- https://physicsopenlab.org/2018/01/18/bragg-diffraction/
- hat Super-Klassen
- Electron Diffraction c
Bragg's Lawc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000065
A condition which (1) is defined as twice the lattice spacing in a large crystal multiplied with the sine of the Bragg angle between the incident beam and a set of lattice planes, being a whole multiple of the radiation wavelength, and (2) if satisfied, may allow to relate the location of a scattering intensity maximum within a diffraction pattern to the corresponding lattice plane spacing.
- hat Super-Klassen
- thing c
Camera Lengthc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000008
Distance which is present between the specimen surface and the detector plane.
- Source
- https://www.doi.org/10.1007/978-3-030-00069-1
- https://www.em.tf.fau.de/2020/04/02/low-energy-electron-diffraction-lend-published-in-ultramicroscopy/
- https://www.globalsino.com/EM/page3245.html
- https://www.jeol.co.jp/en/words/emterms/search_result.html?keyword=camera%20length
- hat Super-Klassen
- thing c
Coherent Beamc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000009
A monochromatic beam which consists of waves that have a defined phase relationship.
- hat Super-Klassen
- Monochromatic Beam c
Convergence Anglec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000010
The angle which is given by the semi-opening angle of the cone in a convergent beam.
- hat Super-Klassen
- thing c
Convergent Beamc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000011
A beam which is conically shaped such that its cross section is decreased to form a disc of least confusion.
- hat Super-Klassen
- Beam c
- hat Sub-Klassen
- Focused Beam c
Dead Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000054
Wait time which is due to a particle detector being physically incapable of registering detector events.
- Source
- https://www.iso.org/obp/ui/#iso:std:iso:15932:ed-1:v1:en
- https://www.iso.org/obp/ui/#iso:std:iso:23833:ed-2:v1:en
- hat Super-Klassen
- Wait Time c
Detector Moving Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000057
Moving time during which either the position or the orientation of a detector is altered.
- hat Super-Klassen
- Moving Time c
Diffractionc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000012
A physical phenomenon during which the direction and intensity of a propagating wave is changed due to interaction with matter having structure dimensions in the order of the wavelength.
- Source
- https://doi.org/10.1016/j.jqsrt.2018.02.002
- https://doi.org/10.1351/goldbook.D01711
- https://en.wikipedia.org/wiki/diffraction
- hat Super-Klassen
- thing c
- hat Sub-Klassen
- Electron Diffraction c
Diffraction Patternc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000013
A pattern which consists of spatial intensity modulation generated by diffraction.
- hat Super-Klassen
- thing c
- hat Sub-Klassen
- Electron Backscatter Diffraction Pattern c, Electron Diffraction Pattern c, Kikuchi Pattern c
Disk Of Least Confusionc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000014
A cross section of a beam at which the beam has the smallest spatial extent.
- hat Super-Klassen
- thing c
Dwell Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000015
Time period during which the beam remains at one position.
- Source
- https://doi.org/10.1007/978-1-4939-6676-9
- https://www.iso.org/obp/ui/#iso:std:iso:22493:ed-2:v1:en
- hat Super-Klassen
- Time Period c
Dynamic Focus Correctionc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000016
Dynamic refocusing which keeps the electron probe focused on the surface of a tilted sample.
- hat Super-Klassen
- Dynamic Refocusing c
Dynamic Refocusingc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000017
A workflow to keep the specimen in focus by automatic means.
- hat Super-Klassen
- thing c
- hat Sub-Klassen
- Dynamic Focus Correction c
Elastic Scatteringc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000018
Scattering during which the particle that is scattered does not change its energy.
- hat Super-Klassen
- Scattering c
Electron Backscatter Diffractionc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000019
Electron diffraction which primarily involves backscattered electrons from a solid sample.
- Source
- https://en.wikipedia.org/wiki/Electron_backscatter_diffraction
- hat Super-Klassen
- Electron Diffraction c
Electron Backscatter Diffraction Patternc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000020
A diffraction pattern which is generated by electron backscatter diffraction.
- hat Super-Klassen
- Diffraction Pattern c
Electron Beamc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000021
A beam which consists of electrons.
- hat Super-Klassen
- Beam c
Electron Diffractionc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000022
Diffraction which is based on a propagating electron wave.
- Source
- https://en.wikipedia.org/wiki/Diffraction
- https://www.sciencedirect.com/topics/chemistry/electron-diffraction#:~:text=Electron%20diffraction%20is%20a%20technique,resulting%20in%20a%20diffraction%20pattern
- hat Super-Klassen
- Diffraction c
- hat Sub-Klassen
- Bragg Diffraction c, Electron Backscatter Diffraction c, Kikuchi Diffraction c
Electron Diffraction Patternc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000023
A diffraction pattern which is generated from electron diffraction.
- hat Super-Klassen
- Diffraction Pattern c
Electron Probec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000024
The part of the beam which interacts with the sample.
- hat Super-Klassen
- thing c
Emission Currentc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000025
Electrical current which is released from the source.
- hat Super-Klassen
- thing c
Extraction Voltagec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000026
Voltage which is utilised to create an electric field that draws particles from the source.
- hat Super-Klassen
- thing c
Filament Currentc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000027
Electrical current which flows through the source.
- hat Super-Klassen
- thing c
Flyback Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000028
Time period during which the beam moves from the final position of one scan line to the starting position of the subsequent scan line.
- hat Super-Klassen
- Time Period c
Focal Lengthc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000029
Distance which lies between the principal plane of the lens and the focal point along the optical axis.
- hat Super-Klassen
- thing c
Focal Planec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000030
Plane which is perpendicular to the optical axis and includes the focal point.
- hat Super-Klassen
- thing c
Focal Pointc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000031
Point which is defined by the intersection of the optical axis and the backwards extrapolated path of a ray that (1) is tending towards infinity, (2) was parallel to the optical axis in the incident beam, and (3) that was deflected by an electron lens.
- Source
- https://www.iso.org/obp/ui/#iso:std:iso:15932:ed-1:v1:en 2.1.4
- https://www.iso.org/obp/ui/#iso:std:iso:22493:ed-2:v1:en 3.1.4
- hat Super-Klassen
- thing c
Focused Beamc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000032
A convergent beam which originates from a coherent beam and whose cross section is decreased to the physically smallest possible disc of least confusion.
- hat Super-Klassen
- Convergent Beam c
Framec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000060
An array of data which represents a coherent and discrete set of time.
- Example
-
A 2D EBSD map containing orientation data.
-
A 2D EDS map with compositional information.
-
A single Kikuchi pattern acquired by an EBSD camera.
-
Any 2D image acquired with an SEM or (S)TEM.
- hat Super-Klassen
- thing c
Frame Flyback Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000033
Time period during which the beam moves from the final position of one frame to the starting position of the subsequent frame.
- hat Super-Klassen
- Time Period c
Frame Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000034
Time period during which a frame is fully scanned.
- Source
- https://doi.org/10.1007/978-1-4939-6676-9
- hat Super-Klassen
- Time Period c
Incident Beamc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000035
Primary beam before it interacts with the specimen.
- hat Super-Klassen
- Primary Beam c
Inelastic Scatteringc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000036
Scattering during which the particle that is scattered changes its energy.
- hat Super-Klassen
- Scattering c
Ion Beamc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000037
A beam which consists of ions.
- hat Super-Klassen
- Beam c
Kikuchi Bandc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000063
Pattern of electron intensity which is (1) formed by electron diffraction, (2) appears as a geometrical feature in a Kikuchi pattern, (3) is an area different in intensity compared to background, and (4) is limited on each side by a Kikuchi line.
- Source
- https://en.wikipedia.org/wiki/Intensity_(physics)
- https://en.wikipedia.org/wiki/Kikuchi_lines_(physics)
- https://www.jeol.com/words/emterms/20121023.015559.php
- hat Super-Klassen
- thing c
Kikuchi Diffractionc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000051
Electron diffraction during which, in a sequential order, electrons of the incident beam are inelastically scattered, form a point source inside the specimen, and leave the specimen through Bragg diffraction.
- hat Super-Klassen
- Electron Diffraction c
- hat Sub-Klassen
- Transmission Kikuchi Diffraction c
Kikuchi Linesc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000062
Patterns of electron intensity which are (1) formed by electron diffraction, (2) appear as a geometrical feature in a Kikuchi pattern as a pair of lines limiting Kikuchi bands.
- Source
- https://www.iso.org/obp/ui/en/#iso:std:iso:22493:ed-2:v1:en (section 6.5.1)
- https://www.jeol.com/words/emterms/20121023.015559.php
- hat Super-Klassen
- thing c
Kikuchi Patternc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000052
A diffraction pattern which is generated by Kikuchi diffraction.
- hat Super-Klassen
- Diffraction Pattern c
Monochromatic Beamc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000038
A beam which consists of particles of the same energy.
- hat Super-Klassen
- Beam c
- hat Sub-Klassen
- Coherent Beam c
Moving Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000058
Time period during which the position or orientation of either the beam or physical components are changed within a coordinate system of the microscope.
- hat Super-Klassen
- Time Period c
- hat Sub-Klassen
- Beam Moving Time c, Detector Moving Time c, Sample Moving Time c
Point Sourcec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000061
Spatial volume which has negligible extent, and from where particles or radiation originate and are emitted in all directions.
- hat Super-Klassen
- thing c
Pole Piecec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000039
A physical part of an electron or ion microscope which is part of the electromagnetic lens and is used to amplify and shape the magnetic field used to manipulate the beam.
- Source
- https://en.wikipedia.org/wiki/Pole_piece
- https://www.jeol.co.jp/en/words/emterms/search_result.html?keyword=polepiece
- hat Super-Klassen
- thing c
Primary Beamc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000040
A beam which is unaltered in terms of its direction after interaction with the specimen.
- Source
- https://www.iso.org/obp/ui/#iso:std:iso:15932:ed-1:v1:en
- https://www.iso.org/obp/ui/#iso:std:iso:23833:ed-2:v1:en
- hat Super-Klassen
- Beam c
- hat Sub-Klassen
- Incident Beam c
Probe Currentc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000041
Electrical current which arrives at the specimen.
- hat Super-Klassen
- thing c
Region Of Interestc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000042
Area which is (1) on the specimen and (2) to be sampled during an experiment.
- hat Super-Klassen
- thing c
Sample Moving Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000059
Moving time during which either the position or the orientation of the sample is altered.
- hat Super-Klassen
- Moving Time c
Scatteringc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000043
A physical phenomenon during which the trajectory of a particle is changed due to interaction with matter.
- Source
- https://doi.org/10.1016/j.jqsrt.2018.02.002
- hat Super-Klassen
- thing c
- hat Sub-Klassen
- Elastic Scattering c, Inelastic Scattering c, SEM Backscattering c, TEM Backscattering c, TEM Forwardscattering c
Scattering Anglec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000044
The angle which spans between the tangent of the incoming trajectory of an particle and the the tangent of the outgoing trajectory of the same particle, prior and past an instance of scattering.
- hat Super-Klassen
- thing c
SEM Backscatteringc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000001
Scattering during which electrons of an incident beam are scattered by a specimen, such that some of the scattered particles leave the specimen via the incident surface again.
- Source
- Ludwig Reimer, Scanning Electron Microscopy - Physics of Image Formation and Microanalysis (ISBN 978-3-642-08372-3) - pages 57ff
- hat Super-Klassen
- Scattering c
Sourcec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000045
A physical part of an electron or ion microscope from which the particles that form the beam are emitted.
- Source
- https://cmrf.research.uiowa.edu/scanning-electron-microscopy
- Example
-
LaB_6 crystal
-
liquid metal Gallium
-
tungsten crystal
-
tungsten wire
- hat Super-Klassen
- thing c
Specimenc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000046
A physical entity which contains material intended to be investigated.
- Source
- https://biolincc.nhlbi.nih.gov/glossary/
- https://doi.org/10.1351/pac199062061193
- https://goldbook.iupac.org/terms/view/S05809
- hat Super-Klassen
- thing c
TEM Backscatteringc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000002
Scattering which results in scattered electrons with an absolute scattering angle larger than 90 degrees.
- Source
- Ludwig Reimer, Scanning Electron Microscopy - Physics of Image Formation and Microanalysis (ISBN 978-3-642-08372-3) - pages 57ff
- hat Super-Klassen
- Scattering c
TEM Forwardscatteringc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000003
Scattering which results in scattered electrons with an absolute scattering angle smaller than 90 degrees.
- Source
- Ludwig Reimer, Scanning Electron Microscopy - Physics of Image Formation and Microanalysis (ISBN 978-3-642-08372-3) - pages 57ff
- hat Super-Klassen
- Scattering c
Tilt Correctionc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000047
An imaging setting which can be used during acquisition to correct perspective distortion when imaging a tilted surface or cross section.
- hat Super-Klassen
- thing c
Time Periodc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000048
An interval of time.
- hat Super-Klassen
- thing c
- hat Sub-Klassen
- Acquisition Time c, Dwell Time c, Flyback Time c, Frame Flyback Time c, Frame Time c, Moving Time c, Wait Time c
Transmission Kikuchi Diffractionc zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000053
Kikuchi diffraction during which electrons leave the electron-transparent sample at the side opposite to the incident beam.
- hat Super-Klassen
- Kikuchi Diffraction c
Wait Timec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000049
Time period in which no data are acquired.
- hat Super-Klassen
- Time Period c
- hat Sub-Klassen
- Dead Time c
Working Distancec zurück zur Übersicht oder Klassenübersicht
IRI: https://purls.helmholtz-metadaten.de/emg/EMG_00000050
Distance which is determined along the optical axis within the column from (1) the lower end of the final optical element between the source and the specimen stage; to (2) the point where the beam is focused.
- Source
- https://www.globalsino.com/EM/page4586.html
- hat Super-Klassen
- thing c
Legende zurück zu ToC
c: Klassen
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Danksagung zurück zum Inhaltsverzeichnis
Die Autoren bedanken sich beiSilvio Peroni für die Entwicklung von LODE, einer Umgebung zur Live-OWL-Dokumentation, die im Abschnitt Querverweise für die Darstellung verwendet wird, bei Daniel Garijo für die Entwicklung von Widoco, welches für die Templates in dieser Anwendung verwendet wird.